Our client is a market leader producer of Integrated Circuits Lithography and Metrology machines, based in the Netherlands. This project is aimed at one of the metrology systems used to measure the overlay and critical distance on the wafers produced by the lithography machines. The development work is purely back-end.
Team: Target number of people is approximately 9 out of which 6 will be from Luxoft and the rest from the client
Working location: Eindhoven
Nice to have
English: B2 Upper Intermediate
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